SEM/EDS Analysis
The Scanning Electron Microscope (SEM) and Energy Dispersive Spectrometer (EDS) provides high resolution imaging of samples and elemental detection of inclusions, debris, stains, and contaminants. The SEM provides highly detailed images with greater depth of field as compared to optical microscopy techniques. Compositional analysis can be accomplished with the EDS. Tests conform to ASTM E1508.
Want more information or would like to receive a quote? Fill out the information request form below to speak with one of our qualified engineers.
SEM/EDS Analysis Data Sheets
SEM/EDS Analysis Sample Report
SEM/EDS Analysis NDA Agreement
Information Request
Have a question? Can’t find what you’re looking for? Call us at 860.747.6333, or submit an information request form and someone will get back to you within 48 hours.