SEM/EDS Analysis
The Scanning Electron Microscope (SEM) and Energy Dispersive Spectrometer (EDS) provides high resolution imaging of samples and elemental detection of inclusions, debris, stains, and contaminants. The SEM provides highly detailed images with greater depth of field as compared to optical microscopy techniques. Compositional analysis can be accomplished with the EDS. Tests conform to ASTM E1508.
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SEM/EDS Analysis Data Sheets
SEM/EDS Analysis Sample Report
SEM/EDS Analysis NDA Agreement
Information Request
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